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![]() ![]() Atomic-scale imaging of individual atoms.Chemical analysis and high-resolution elemental mappingĪdvantages of Transmission Electron Microscopy (TEM).Imaging atomic-level defects such as dislocations, lattice defects, grain boundaries, etc.Sub nanometer atomic lattice dimension mapping.Asbestos identification in construction material. ![]() Ultra-high precision thickness measurement of atomic layers in physical vapor deposition or atomic layer deposition techniques.Imaging atomic level boundaries in semiconductors.Our testing lab experts work tirelessly to provide a world-class TEM testing experience.Ĭommon Uses of Transmission Electron Microscopy (TEM) Our testing labs are well equipped to carry out all the routine and tailor-made Transmission Electron Microscopy analyses for the benefit of our clients based in the USA and other parts of the world. containing different information about the specimen. High energy electrons interact with the specimen to produce various signals such as x-rays, elastically and inelastically scattered electrons, Auger, backscattered electrons, etc. In TEM, electrons transmitted through a specimen are analyzed. The elemental distribution could be quantified and mapped. It is possible to image the atomic arrangement of the materials (1-2 A resolution), atomic defects, variation in a lattice arrangement across boundaries, chemical or composition changes, determine the crystal structure and orientation, etc. The images obtained allow us to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. This electron beam generates a highly magnified image of the atoms it interacts with. TEM is a powerful microscopy technique used in testing labs, in which a beam of electrons is allowed to transmit through an ultra-thin specimen in order to interact with the atoms of the specimen. Transmission Electron Microscopyīefore we understand what is TEM or Transmission Electron Microscopy, we need to understand that TEM is a powerful tool for imaging, spectroscopy, and diffraction analysis. TEM performed in our testing labs helps to determine atomic-level structural characteristics of materials required for product design and application. A Transmission Electron Microscope is the most powerful microscopic instrument available and it is used to produce images of electron beam interaction with a sample. Transmission Electron Microscopy or TEM is a powerful tool for imaging, spectroscopy, and diffraction analysis. ![]()
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